David R. Barbero , PhD
Dr. David R. Barbero ist Ingenieur und Physiker und verfügt über mehr als 15 Jahre Erfahrung mit optoelektronischen Materialien, Geräten und Displays im Nanobereich. Seine Arbeiten wurden in mehreren führenden Fachzeitschriften für Materialwissenschaft und Physik veröffentlicht und in über 300 wissenschaftlichen Zeitungen und Internet-Websites vorgestellt. Er verfügt über langjährige Erfahrung in der Nanomusterung und Nanostrukturierung von Polymeren und Verbundwerkstoffen (optische Lithografie, Nanoimprinting, kolloidale Nanoröhren und Polymerselbstorganisation). David promovierte in Physik am Cavendish Laboratory der Universität Cambridge (Vereinigtes Königreich), wo er als Marie-Curie-Stipendiat und European Cambridge Trust Scholar tätig war. 2009 wurde er mit dem Abdus-Salam-Zweitplatzierten-Preis der Universität Cambridge in Physik ausgezeichnet.
Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Graterkennung während der Batterieherstellung
Erfahren Sie, wie die optische Mikroskopie zur Graterkennung an Batterieelektroden und zur Bestimmung des Schadenspotenzials eingesetzt werden kann, um eine schnelle und zuverlässige…
Erkennung von Batteriepartikeln während des Produktionsprozesses
In diesem Artikel wird erläutert, wie die Partikelerkennung und -analyse von Batterien mit optischer Mikroskopie und Laserspektroskopie für eine schnelle, zuverlässige und kostengünstige…
Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection for QC of materials like wafers can be challenging. Microscope solutions that offer several contrast methods enable fast and reliable defect detection and efficient workflows.
Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Studying Ocular Birth Defects
This article discusses how lens formation and ocular birth defects can be studied with sharp widefield microscopy images which are acquired rapidly. The mouse ocular lens is used as a model to study…
Factors to Consider for a Cleanliness Analysis Solution
Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
![[Translate to German:] Particles and fibers on a filter which will be counted and analyzed for cleanliness](/fileadmin/academy/2022/Efficient_particle_counting_and_analysis/Particles_and_fibers_on_a_filter.jpg "[Translate to German:] Particles and fibers on a filter which will be counted and analyzed for cleanliness")
Effiziente Partikelzählung und -analyse
Dieser Bericht befasst sich mit der Partikelzählung und -analyse unter Verwendung der optischen Mikroskopie bei der technischen Sauberkeitsanalyse von Teilen und Komponenten. Die Partikelzählung und…
![[Translate to German:] Particles which could be found during cleanliness analysis of parts and components.](/fileadmin/_processed_/8/f/csm_Particles_found_during_cleanliness_analysis_b09473be0e.jpg "[Translate to German:] Particles which could be found during cleanliness analysis of parts and components.")
Technische Sauberkeit von Automobilkomponenten und -teilen
In diesem Artikel werden die ISO-Norm 16232 und die VDA 19-Richtlinien erläutert und die Verfahren zur Partikelanalyse kurz zusammengefasst. Diese liefern wichtige Kriterien für die Sauberkeit von…
Top Challenges for Visual Inspection
This article discusses the challenges encountered when performing visual inspection and rework using a microscope. Using the right type of microscope and optical setup is paramount in order to…
![[Translate to German:] Routine inspection microscope Ivesta 3](/fileadmin/_processed_/a/a/csm_Ivesta_3_integrated_monitor_users_2_fc7f6bf183.jpg "[Translate to German:] Routine inspection microscope Ivesta 3")
How to select the right solution for visual inspection
This article helps users with the decision-making process when selecting a microscope as a solution for routine visual inspection. Important factors that should be considered are described.
Introduction to 21 CFR Part 11 and Related Regulations
This article provides an overview of regulations and guidelines for electronic records (data entry, storage, signatures, and approvals) used in the USA (21 CFR Part 11), EU (GMP Annex 11), and China…
Why is Manual Visual Inspection of Medical Devices so Challenging?
This article discusses how manual visual inspection, which is prevalent in the medical device industry, can lead to inconsistent results. It also addresses the challenges quality managers and…
Keeping Particulate Contamination Under Control in Pharmaceutical Products
This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…
How does an Automated Rating Solution for Steel Inclusions Work?
The rating of non-metallic inclusions (NMIs) to determine steel quality is critical for many industrial applications. For an efficient and cost-effective steel quality evaluation, an automated NMI…
Challenges Faced When Manually Rating Non-Metallic Inclusions (NMIs) to Determine Steel Quality
Rapid, accurate, and reliable rating of non-metallic inclusions (NMIs) is instrumental for the determination of steel quality. This article describes the challenges that arise from manual NMI rating,…
Reasons Why There is Growing Need for Fast and Reliable Steel Quality Rating Solutions
Steel quality is critical for the manufacturing of high-quality components and products. Fast, reliable, and accurate detection and classification of inclusions has become essential for both component…