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![[Translate to German:] Particles which could be found during cleanliness analysis of parts and components.](/fileadmin/_processed_/8/f/csm_Particles_found_during_cleanliness_analysis_9909ee7c63.jpg "[Translate to German:] Particles which could be found during cleanliness analysis of parts and components.")
Technische Sauberkeit von Automobilkomponenten und -teilen
In diesem Artikel werden die ISO-Norm 16232 und die VDA 19-Richtlinien erläutert und die Verfahren zur Partikelanalyse kurz zusammengefasst. Diese liefern wichtige Kriterien für die Sauberkeit von…
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Keeping Particulate Contamination Under Control in Pharmaceutical Products
This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…
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Depth Profiling and Layer Analysis for Inspection of Materials with a 2-In-1 Solution Combining Optical Microscopy and Laser Spectroscopy
In addition to simultaneous visual and chemical inspection, a 2-methods-in-1 materials analysis solution, which combines optical microscopy and laser induced breakdown spectroscopy (LIBS), can also be…
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Performing Elemental Analysis down to the Micro Scale
If you work in electronic component analysis, you will be familiar with the many challenges posed. Whether you are identifying metallic particles or checking product authenticity, it’s important to…
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Simplify and Speed Up Element Analysis at the Micron Range
Learn how to get spatially resolved information about the chemical composition of elements in seconds - quickly and easily.
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See the Structure with Microscopy - Know the Composition with Laser Spectroscopy
The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…
