Science Lab
Science Lab
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Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
How to Successfully Perform Live-cell CLEM
The Leica Nano workflow provides a streamlined live-cell CLEM solution for getting insight bout structural changes of cellular components over time. Besides the technical handling described in the…
Capture life as it happens
With the Leica Nano Workflow, searching for the needle in the haystack is a thing of the past. Take advantage of correlative light and electron microscopy to identify directly the right cell at the…
Investigating Synapses in Brain Slices with Enhanced Functional Electron Microscopy
A fundamental question of neuroscience is: what is the relationship between structural and functional properties of synapses? Over the last few decades, electrophysiology has shed light on synaptic…
Fast Visual and Chemical Analysis of Contamination and Underlying Layers
Visual and chemical analysis of contamination on materials with a 2-methods-in-1 solution leading to an efficient, more complete analysis workflow is described in this report. A 2-in-1 solution,…
Microscopy in Virology
The coronavirus SARS-CoV-2, causing the Covid-19 disease effects our world in all aspects. Research to find immunization and treatment methods, in other words to fight this virus, gained highest…
Top Issues Related to Standards for Rating Non-Metallic Inclusions in Steel
Supplying components and products made of steel to users worldwide can require that a single batch be compliant with multiple steel quality standards. This user demand creates significant challenges…
Analyzing Non-metallic Inclusions in Steel
Oftentimes we find ourselves caught up in tedious analyses by reticle and comparison chart, time-consuming double-evaluation according to several standards or subjective inspection results with a bias…
Performing Elemental Analysis down to the Micro Scale
If you work in electronic component analysis, you will be familiar with the many challenges posed. Whether you are identifying metallic particles or checking product authenticity, it’s important to…
