Leica Microsystems: Science Lab

Science Lab

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Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…

How to Successfully Perform Live-cell CLEM

The Leica Nano workflow provides a streamlined live-cell CLEM solution for getting insight bout structural changes of cellular components over time. Besides the technical handling described in the…

Capture life as it happens

With the Leica Nano Workflow, searching for the needle in the haystack is a thing of the past. Take advantage of correlative light and electron microscopy to identify directly the right cell at the…

Investigating Synapses in Brain Slices with Enhanced Functional Electron Microscopy

A fundamental question of neuroscience is: what is the relationship between structural and functional properties of synapses? Over the last few decades, electrophysiology has shed light on synaptic…

Microscopy in Virology

The coronavirus SARS-CoV-2, causing the Covid-19 disease effects our world in all aspects. Research to find immunization and treatment methods, in other words to fight this virus, gained highest…

Top Issues Related to Standards for Rating Non-Metallic Inclusions in Steel

Supplying components and products made of steel to users worldwide can require that a single batch be compliant with multiple steel quality standards. This user demand creates significant challenges…

Analyzing Non-metallic Inclusions in Steel

Oftentimes we find ourselves caught up in tedious analyses by reticle and comparison chart, time-consuming double-evaluation according to several standards or subjective inspection results with a bias…

Performing Elemental Analysis down to the Micro Scale

If you work in electronic component analysis, you will be familiar with the many challenges posed. Whether you are identifying metallic particles or checking product authenticity, it’s important to…

Introduction to Ion Beam Etching with the EM TIC 3X

In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…