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Science Lab

Das Wissensportal von Leica Microsystems bietet Ihnen Wissens- und Lehrmaterial zu den Themen der Mikroskopie. Die Inhalte sind so konzipiert, dass sie Einsteiger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrem alltäglichen Vorgehen und Experimenten unterstützen. Entdecken Sie interaktive Tutorials und Anwendungsberichte, erfahren Sie mehr über die Grundlagen der Mikroskopie und High-End-Technologien - werden Sie Teil der Science Lab Community und teilen Sie Ihr Wissen!
Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Image of a Siemens star, where the diameter of the 1st black line circle is 10 mm and the 2nd is 20 mm, taken via an eyepiece of a M205 A stereo microscope. The rectangles represent the field of view (FOV) of a Leica digital camera when installed with various C-mounts (red 0.32x, blue 0.5x, green 0.63x).

Understanding Clearly the Magnification of Microscopy

To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
[Translate to German:] Stereo microscopes are often considered the workhorses of laboratories and production sites.

Wichtige Faktoren, die Sie bei der Auswahl eines Stereomikroskops berücksichtigen sollten

Stereomikroskope zeichnen sich durch ihre Fähigkeit aus, einen 3D-Eindruck der Probe zu erzeugen. Daher eignen sie sich besonders gut für Inspektion und Nacharbeit, Qualitätskontrolle, Forschung und…
The Emspira 3 digital microscope offers what users need for comprehensive visual inspection, including comparison, measurement, and documentation sharing.

Digital Inspection Microscope for Industrial Applications

Factors users should consider before choosing a digital inspection microscope for industrial applications, including quality control (QC), failure analysis (FA), and R&D, are described in this…
Inspection microscope image of a printed circuit board (PCB) taken with a ring light (RL) and near vertical illumination (NVI).

Microscope Illumination for Industrial Applications

Inspection microscope users can obtain information from this article which helps them choose the optimal microscope illumination or lighting system for inspection of parts or components.
Documentation of an automotive clutch friction surface with a digital microscope

Verifying Specifications for Auto Parts and Components

During the development and production of automotive parts and components, whether by suppliers or the auto manufacturer, specifications must be met. This goal is important, because the specifications…
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