Science Lab

Das Wissensportal von Leica Microsystems bietet Ihnen Wissens- und Lehrmaterial zu den Themen der Mikroskopie. Die Inhalte sind so konzipiert, dass sie Einsteiger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrem alltäglichen Vorgehen und Experimenten unterstützen. Entdecken Sie interaktive Tutorials und Anwendungsberichte, erfahren Sie mehr über die Grundlagen der Mikroskopie und High-End-Technologien - werden Sie Teil der Science Lab Community und teilen Sie Ihr Wissen!

Partikel auf der Oberfläche einer Partikelfalle, die für die technische Sauberkeit bei der Batterieproduktion eingesetzt werden kann.

Erkennung von Batteriepartikeln während des Produktionsprozesses

In diesem Artikel wird erläutert, wie die Partikelerkennung und -analyse von Batterien mit optischer Mikroskopie und Laserspektroskopie für eine schnelle, zuverlässige und kostengünstige…

Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.

Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.

Material sample with a large height, size, and weight being observed with an inverted microscope.

Five Inverted-Microscope Advantages for Industrial Applications

With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…

Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…

Electric car or EV car charging in station. Eco-friendly alternative energy concept.

Alternative Fuels and Why Sustainable Solutions are Important

This free on-demand webinar is about the role of alternative fuel vehicles and why sustainable solutions are of increasing importance to the automotive industry.

Technical Cleanliness in the Automotive Industry for Electromobility

This free on-demand webinar covers the increasing focus on technical cleanliness in the automotive industry for electromobility and the VDA 19.1 revision.

Optical microscope image of salt contamination on an aluminum/silicon (Al/Si) surface. Credit: Gerweck GmbH, Germany.

Microscopic Defects in Electroplating

This free on-demand webinar shows how to identify quickly root causes of defects during electroplating of components with optical microscopy and LIBS (laser spectroscopy).

3 Factors Determine the Damage Potential of Particles

This article discusses the 3 factors for determining the potential of a particle to cause damage to parts and components in the automotive and electronic industry. These factors include the…