Leica Microsystems: Science Lab

Science Lab

Das Wissensportal von Leica Microsystems bietet Ihnen Wissens- und Lehrmaterial zu den Themen der Mikroskopie. Die Inhalte sind so konzipiert, dass sie Einsteiger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrem alltäglichen Vorgehen und Experimenten unterstützen. Entdecken Sie interaktive Tutorials und Anwendungsberichte, erfahren Sie mehr über die Grundlagen der Mikroskopie und High-End-Technologien - werden Sie Teil der Science Lab Community und teilen Sie Ihr Wissen!

Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality

Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…

Rate the Quality of Your Steel: Free Webinar and Report

This webinar and report describe optimal microscopy solutions for rating steel quality in terms of non-metallic inclusions and reviews the various international and regional standards concerning…

Metallography – an Introduction

This article gives an overview of metallography and metallic alloy characterization. Different microscopy techniques are used to study the alloy microstructure, i.e., microscale structure of grains,…

Measuring grains size with Abrams Three-Circle Procedure.

How to Adapt Grain Size Analysis of Metallic Alloys to Your Needs

Metallic alloys, such as steel and aluminum, have an important role in a variety of industries, including automotive and transportation. In this report, the importance of grain size analysis for alloy…

See the Structure with Microscopy - Know the Composition with Laser Spectroscopy

The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…

Practical Applications of Broad Ion Beam Milling

Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…