Science Lab

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Introduction to Ion Beam Etching with the EM TIC 3X

In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…

Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality

Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

Rate the Quality of Your Steel: Free Webinar and Report

This webinar and report describe optimal microscopy solutions for rating steel quality in terms of non-metallic inclusions and reviews the various international and regional standards concerning…

Simplify and Speed Up Element Analysis at the Micron Range

Learn how to get spatially resolved information about the chemical composition of elements in seconds - quickly and easily.

Metallography – an Introduction

This article gives an overview of metallography and metallic alloy characterization. Different microscopy techniques are used to study the alloy microstructure, i.e., microscale structure of grains,…

Measuring grains size with Abrams Three-Circle Procedure.

How to Adapt Grain Size Analysis of Metallic Alloys to Your Needs

Metallic alloys, such as steel and aluminum, have an important role in a variety of industries, including automotive and transportation. In this report, the importance of grain size analysis for alloy…

See the Structure with Microscopy - Know the Composition with Laser Spectroscopy

The advantages of a 2-in-1 materials analysis solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) for simultaneous visual and chemical inspection are described in…

Practical Applications of Broad Ion Beam Milling

Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…