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3 Factors Determine the Damage Potential of Particles

This article discusses the 3 factors for determining the potential of a particle to cause damage to parts and components in the automotive and electronic industry. These factors include the…

The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…

Cleanliness Analysis for Particulate Contamination

Devices, products, and their components fabricated in many industries can be quite sensitive to contamination and, as a result, have stringent requirements for technical cleanliness. Measurement…

[Translate to German:] Particles and fibers on a filter which will be counted and analyzed for cleanliness

Effiziente Partikelzählung und -analyse

Dieser Bericht befasst sich mit der Partikelzählung und -analyse unter Verwendung der optischen Mikroskopie bei der technischen Sauberkeitsanalyse von Teilen und Komponenten. Die Partikelzählung und…

Quality Control Under the Microscope

Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…

When particulate contamination is present in lubricating fluids or oils, it can cause damage to parts or components leading to malfunctions.

Hydraulics in the Automotive and Aerospace Industries

Cleanliness standards relating to lubricants, hydraulic fluids, and oils, e.g., ISO 4406 and DIN 51455 are discussed in this article. Cleanliness plays a central role in the automotive and…

[Translate to German:] Particles which could be found during cleanliness analysis of parts and components.

Technische Sauberkeit von Automobilkomponenten und -teilen

In diesem Artikel werden die ISO-Norm 16232 und die VDA 19-Richtlinien erläutert und die Verfahren zur Partikelanalyse kurz zusammengefasst. Diese liefern wichtige Kriterien für die Sauberkeit von…

Particle analysis with LIBS using the DM6 M LIBS 2-in-1 solution: Particle of brass, an alloy of copper (Cu) and zinc (Zn).

High Speed for Your Material Analysis Workflow

Learn from our expert, Dr. Konstantin Kartaschew, how the intelligent combination of light microscopy with laser-induced breakdown spectroscopy (LIBS) will truly accelerate your root-cause-analysis…

How to Boost your Microelectronic Component Inspection Performance

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes? Watch this free webinar…