Science Lab
Science Lab
Das Wissensportal von Leica Microsystems bietet Ihnen Wissens- und Lehrmaterial zu den Themen der Mikroskopie. Die Inhalte sind so konzipiert, dass sie Einsteiger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrem alltäglichen Vorgehen und Experimenten unterstützen. Entdecken Sie interaktive Tutorials und Anwendungsberichte, erfahren Sie mehr über die Grundlagen der Mikroskopie und High-End-Technologien - werden Sie Teil der Science Lab Community und teilen Sie Ihr Wissen!
Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
Hochwertige EBSD-Probenvorbereitung
Es wird eine zuverlässige und effiziente EBSD-Probenvorbereitung von „gemischten“ kristallografischen Materialien mit Ionenbreitstrahlfräsen beschrieben. Das beschriebene Verfahren erzeugt…
Advancing Cellular Ultrastructure Research
Freeze-fracture and freeze-etching are useful tools for studying flexible membrane-associated structures such as tight junctions or the enteric glycocalyx. Freeze-fracture and etching are two…
Introduction to Ion Beam Etching with the EM TIC 3X
In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…
Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality
Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…
Brief Introduction to Surface Metrology
This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…
Studying the Microstructure of Natural Polymers in Fine Detail
The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
Expert Knowledge on High Pressure Freezing and Freeze Fracturing in the Cryo SEM Workflow
Get an insight in the working methods of the laboratory and learn about the advantages of Cryo SEM investigation in EM Sample Preparation. Find out how high pressure freezing, freeze fracturing and…
High Resolution Array Tomography with Automated Serial Sectioning
The optimization of high resolution, 3-dimensional (3D), sub-cellular structure analysis with array tomography using an automated serial sectioning solution, achieving a high section density on the…
