EM TRIM2
Preparación de muestras de ME
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Leica Microsystems
EM TRIM2 Dispositivo de desbaste de muestras para TEM, SEM y LM
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Workflow Solutions for Sample Preparation Methods for Material Science
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Brief Introduction to Specimen Trimming
Before ultrathin sectioning a sample with an ultramicrotome it has to be pre-prepared. For this pre-preparation, special attention must be paid to the sample size (size of the section), location of…
Perusing Alternatives for Automated Staining of TEM Thin Sections
Contrast in transmission electron microscopy (TEM) is mainly produced by electron scattering at the specimen: Structures that strongly scatter electrons are referred to as electron dense and appear as…
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Microscopios para la industria del automóvil y el transporte
Nuestras soluciones inteligentes para la captura y procesamiento de imágenes le ayudan a dirigir aplicaciones especiales con las que satisfacer sus necesidades, tanto presentes como futuras, lo que le…
