DM1750 M
정립 현미경
광학 현미경
제품소개
홈
Leica Microsystems
DM1750 M 재료 분석 현미경
Oblique illumination
For a quick surface inspection of your metal samples the oblique illumination is integrated with every Leica DM1750 M. By pressing one of the OBL buttons on the right side illumination keyboard, the oblique illumination is activated and the light arrives with a deviation angle of the beam path onto…
Objectives for your demand
High class objectives are available for each budget, from the HI PLAN series with outstanding flatness, contrast, and color correction to research class objectives that meet even the highest expectations. Also available: series of extra long working distance objectives for a safer inspection in the…
