EM TRIM2
전자현미경 시료 전처리
제품소개
홈
Leica Microsystems
EM TRIM2 TEM, SEM, LM용 시료 트리밍장치
보관된제품
교체된제품
EM RAPID
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Workflow Solutions for Sample Preparation Methods for Material Science
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Brief Introduction to Specimen Trimming
Before ultrathin sectioning a sample with an ultramicrotome it has to be pre-prepared. For this pre-preparation, special attention must be paid to the sample size (size of the section), location of…
Perusing Alternatives for Automated Staining of TEM Thin Sections
Contrast in transmission electron microscopy (TEM) is mainly produced by electron scattering at the specimen: Structures that strongly scatter electrons are referred to as electron dense and appear as…
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