EM RES102
이온 빔 밀링 시스템-Ion Beam Milling
전자현미경 시료 전처리
제품소개
홈
Leica Microsystems
EM RES102
보관된제품
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Google Scholar에서 관련 문서 검색
- Reducing the Formation of FIB-Induced FCC Layers on Cu-Zn-Al Austenite
Eugenia Zelaya, EMAT, University of Antwerp, Belgium, and Dominique Schryvers, Consejo Nacional de Investigaciones Cientificas y Técnicas, Argentina, Microsc Res. Tech. 2011 Jan;74(1):84-91. doi: 10.1002/jemt.20877
http://onlinelibrary.wiley.com/doi/10.1002/jemt.20877/abstract?deniedAccessCustomisedMessage=&userIsAuthenticated=false - Nanometer to micrometer scaled inhomogeneous etching of bulk metallic glasses by ion sputtering, J.W. Deng, K.Du, B.Wu, M.L. Sui, Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang, China, Institute of Microstructure and Property of Advanced Materials, Beijing University of Technology, Beijing, China, Elsevier, Intermetallics, Volume 34, March 2013, Pages 75-82
http://www.sciencedirect.com/science/article/pii/S0966979512004153 - TEM Investigation of Metal/Ceramic Interfaces in AA7475/AIN or Al2O3 Nano-Composites,Solid State Phenomena (Volume 186), Electron Microscopy XIV, Marta Gajewska, Jan Dutkiewicz, Lidia Lityńska-Dobrzyńska, Jerzy Morgiel, Institute of Metallurgy and Materials Science, Polish Academy of Sciences, Rymonta 25, Poland,Solid State Phenomena (Volume 186), Electron Microscopy XIV
http://www.scientific.net/SSP.186.202 - Microstructures and magnetic properties of L11 CoPt thin films with additions of SiO2 and MgO, An-Cheng Suna, Chuan-Fa Huanga, F.T. Yuanb, Jen-Hwa Hsub, a Department of Chemical Engineering and Materials Science, Yuan Ze University, 135 Yuan-Tung Road, Chung-Li 32003, Taiwan, b Department of Physics, National Taiwan University, 1, Roosevelt Road, Sec. 4, Taipei 10617, Taiwan,
http://www.sciencedirect.com/science/article/pii/S0040609013001521
