DM3 XL Inspection System for Microelectronics and Semiconductor
Fast detection, fast action
Archived Product
This item has been phased out and is no longer available. Please contact us to enquire about recent alternative products that may suit your needs.
Speed matters in inspection, process control, or defect and failure analysis for the microelectronics and semiconductor industry. The faster you detect a defect, the faster you can react.
30% more field of view
With a large field of view, the DM3 XL inspection system allows your team to identify defects faster and increase your yield rate. Make use of the 30% increased field of view of the unique macro objective.
