Components

DM6 M LIBS Material Analysis Microscope includes:

Quantity

DM6 M Basisstativ RL/TL, LED, mot. Z

11889193
1

Dust cover for DM4/6

11505168
1

Bodenplatte mit Filtermagazin

11888100
1

Reflektor BF, fixed

11888716
1

Smart Move l²C

11525232
1

Reflektor DF DM8000/DM12000

11888740 
1

CTR compact XY

11525227
1

LED lamp housing DM6, cable long

11504242
1

Tube HC L2TU 4/5/7, binoc. Phototube

11501598
1

Eyepiece HC PLAN s 10x/25 Br. M

11507808 
2

Stage insert 160x116x7mm

11532701
1

Universal MSH 2x2 for Metallography

11533111
1

Stage Insert for MSH(1x) on DM4-6 M

11533110
1

Glass plate 160x116x3mm; for industrial

11600183
1

Scanning stage mot., DM4-6, 100x100,2mm

11501260
1

Metal insert 160x116 f.Scan.-St.100x80

11532502
1

Cable scanningstage, XY-adv. Board

11525218
1

Condenser BF

11505141
1

Condenser head achr. 0.50 S15

11501037
1

Obj. HC PL FL 5x/0.15 BD

11566046
1

Obj. HC PL FL 10x/0.30 BD

11566503
1

Obj. HC PL FLUOTAR 20x/0.45 BD

11566509
1

Obj. HC PL FLUOTAR 50x/0.80 BD

11566201
1

Obj. HC PL FLUOTAR 100x/0.90 BD

11566203
1

Leica K5C Camera

11547118
1

C-Mount adapter 1x HC f. 1"

11541510
1

LIBS Standard Probe

11560204
1

SpectralTools Lizenz

11560205
1

LIBS Modul, komplett

11560200
1

LIBS Reflektorwürfel

11561105
1

Obj. 20x/0.40 LIBS NUV

11518149
1

Eingriffschutz für motorischen Tisch

11560201
1

HP E27k G5 27" UHD

11533663
1

Silver Workstation

11640714
1

>Specifications

  • Including Light Manager for a time saving and easy operation. 
  • For a very fast overview on the sample the 1.25x objective can be adapted. 
  • The integrated Contrast Manager adjusts the required settings for each objective and contrast mode fully automatically and so allows easy operation for each user.
  • 27“ 4k HDMI Monitor
  • W2 Workstation (for imaging with xyz-motorized Microscopes)
  • Motorized Z-drive
  • With magnification changer
  • Phototube HC L2TU 4/5/6
  • Motorized objective turret
  • With DF contrast
  • Automated (motorized + scanning)
  • Scanning stage 100x100 (2mm)
  • Metal insert 160x116
  • LIBS standard sample

DM6 M LIBS Material Analysis Microscope

LIBS Microscope Solution for Materials Analysis

Fields of Application

Metallography

Leica metallographic microscopes are optimized for the microstructural analysis of metals, alloys, and other materials.

Automotive & Transportation

We at Leica want to be your dependendable collaborators, guiding you to optimal imaging solutions for automotive and transportation, so you can stay ahead of the competition. Our smart imaging…

Materials & Earth Science

You need the right tools for reliable, high-quality imaging and analysis. Leica Microsystems is the single source for all your research needs. Along with expert local support, we offer a broad range…

Technical Cleanliness

For industrial and electronics manufacturers as well as non-regulated pharma applications, solutions for an efficient technical cleanliness offer significant advantages.

Automated Microscopes

Automated microscopes are very useful for applications which require many repetitious observations over a long period of time. Examples are live-cell imaging or high-throughput analysis for quality…

Material Analysis Microscopes

Materials analysis requires microscope solutions for the imaging, measurement, and analysis of features across a variety of materials like metal alloys, semiconductors, glass and ceramics, as well as…

Industrial Microscopy Markets

Maximizing uptime and achieving targets efficiently help your bottom line. Leica microscope solutions can give you insights into the smallest sample details as well as analyze, document, and report…

Metal Industry

Leica microscope solutions for the metal industry are useful for assessing the quality of materials and ensuring compliance with applicable standards.

Cross-Section Analysis for Electronics

Cross-section analysis for electronics enables detailed analysis of failure mechanisms of components like printed circuit boards (PCBs), assemblies (PCBAs), and integrated circuits (ICs).

Electronics and Semiconductor Industry

For electronics and semiconductors, solutions enabling efficient inspection, cross-section and cleanliness analysis, and R&D of PCBs, wafers, IC chips, and batteries are crucial.

Battery Manufacturing

Battery manufacturing has several key challenges concerning inspection. Solutions for sample preparation and microscopic visual and chemical analysis are needed.

Measurement Microscopes

Measurement microscopes are useful for determining sample-feature dimensions during QC, failure analysis, and R&D. Learn more about Leica measurement microscopes.
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