DM6 M LIBS Material Analysis Microscope
Use the DM6M fully motorized inspection microscope with all contrasting modes and benefit from the huge magnification range starting at 1.25x for fast sample overview. The light and contast manager adjusts the required settings for each objective and contrast mode fully automatically and so allows easy operation for each user. By the possibility of an instantaneous chemical analysis by laser induced breakdown spectroscopy (LIBS) the user gets all required information direct and on the spot within seconds without the need of further sample preparation or transportation to other devices.
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Key Benefits
- The LIBS module turns a Leica optical microscope into a 1-step solution that combines visual inspection and chemical analysis right at your workspace
- Determine the composition of what you have visually identified within seconds
- Use LIBS to perform advanced material analysis 90% faster compared to inspection with SEM/EDS
- Surface contamination or coatings can also be easily removed
- Chemical mapping and micro-drilling are further analytical steps
Components
DM6 M LIBS Material Analysis Microscope includes: |
Quantity |
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|---|---|---|
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DM6 M Basisstativ RL/TL, LED, mot. Z11889193 |
1 |
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Dust cover for DM4/611505168 |
1 |
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Bodenplatte mit Filtermagazin11888100 |
1 |
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Reflektor BF, fixed11888716 |
1 |
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Smart Move l²C11525232 |
1 |
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Reflektor DF DM8000/DM1200011888740 |
1 |
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CTR compact XY11525227 |
1 |
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LED lamp housing DM6, cable long11504242 |
1 |
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Tube HC L2TU 4/5/7, binoc. Phototube11501598 |
1 |
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Eyepiece HC PLAN s 10x/25 Br. M11507808 |
2 |
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Stage insert 160x116x7mm11532701 |
1 |
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Universal MSH 2x2 for Metallography11533111 |
1 |
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Stage Insert for MSH(1x) on DM4-6 M11533110 |
1 |
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Glass plate 160x116x3mm; for industrial11600183 |
1 |
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Scanning stage mot., DM4-6, 100x100,2mm11501260 |
1 |
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Metal insert 160x116 f.Scan.-St.100x8011532502 |
1 |
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Cable scanningstage, XY-adv. Board11525218 |
1 |
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Condenser BF11505141 |
1 |
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Condenser head achr. 0.50 S1511501037 |
1 |
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Obj. HC PL FL 5x/0.15 BD11566046 |
1 |
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Obj. HC PL FL 10x/0.30 BD11566503 |
1 |
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Obj. HC PL FLUOTAR 20x/0.45 BD11566509 |
1 |
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Obj. HC PL FLUOTAR 50x/0.80 BD11566201 |
1 |
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Obj. HC PL FLUOTAR 100x/0.90 BD11566203 |
1 |
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Leica K5C Camera11547118 |
1 |
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C-Mount adapter 1x HC f. 1"11541510 |
1 |
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LIBS Standard Probe11560204 |
1 |
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SpectralTools Lizenz11560205 |
1 |
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LIBS Modul, komplett11560200 |
1 |
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LIBS Reflektorwürfel11561105 |
1 |
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Obj. 20x/0.40 LIBS NUV11518149 |
1 |
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Eingriffschutz für motorischen Tisch11560201 |
1 |
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HP E27k G5 27" UHD11533663 |
1 |
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Silver Workstation11640714 |
1 |
>Specifications
- Including Light Manager for a time saving and easy operation.
- For a very fast overview on the sample the 1.25x objective can be adapted.
- The integrated Contrast Manager adjusts the required settings for each objective and contrast mode fully automatically and so allows easy operation for each user.
- 27“ 4k HDMI Monitor
- W2 Workstation (for imaging with xyz-motorized Microscopes)
- Motorized Z-drive
- With magnification changer
- Phototube HC L2TU 4/5/6
- Motorized objective turret
- With DF contrast
- Automated (motorized + scanning)
- Scanning stage 100x100 (2mm)
- Metal insert 160x116
- LIBS standard sample
DM6 M LIBS Material Analysis Microscope
LIBS Microscope Solution for Materials Analysis
Fields of Application
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Cross-Section Analysis for Electronics
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Electronics and Semiconductor Industry
For electronics and semiconductors, solutions enabling efficient inspection, cross-section and cleanliness analysis, and R&D of PCBs, wafers, IC chips, and batteries are crucial.
Battery Manufacturing
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