EM TIC 3X
Ion Beam Milling
Sample Preparation for Electron Microscopy
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EM TIC 3X Ion Beam Milling System
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Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Structural and Chemical Analysis of IC-Chip Cross Sections
This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
High-Quality EBSD Sample Preparation
This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.
Cross Section Ion Beam Milling of Battery Components
Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…
Download EM Workflow Solutions Booklet
This publication is a compilation of appropriate workflows for the most frequently used sample preparation methods, like Correlative Methodologies, Optogenetics & Electro-Physiology, Surface Analysis,…
Exploring the Structure and Life Cycle of Viruses
The SARS-CoV-2 outbreak started in late December 2019 and has since reached a global pandemic, leading to a worldwide battle against COVID-19. The ever-evolving electron microscopy methods offer a…
Application Booklet for EM TIC 3X
Today, ion beam milling is one of the most widely-used methods for preparing samples for electron microscopy. Download this 76-pages booklet today and learn how to improve your processes.
Workflows and Instrumentation for Cryo-electron Microscopy
Cryo-electron microscopy is an increasingly popular modality to study the structures of macromolecular complexes and has enabled numerous new insights in cell biology. In recent years, cryo-electron…
Introduction to Ion Beam Etching with the EM TIC 3X
In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…
Workflow Solutions for Sample Preparation Methods for Material Science
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Studying the Microstructure of Natural Polymers in Fine Detail
The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
Macroscale to Nanoscale Pore Analysis of Shale and Carbonate Rocks
Physical porosity in rocks, like shale and carbonate, has a large effect on the their storage capacity. The pore geometries also affect their permeability. Imaging the visible pore space provides…
Practical Applications of Broad Ion Beam Milling
Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
Battery Manufacturing
Battery manufacturing has several key challenges concerning inspection. Solutions for sample preparation and microscopic visual and chemical analysis are needed.
Fields of Application
Automotive & Transportation
We at Leica want to be your dependendable collaborators, guiding you to optimal imaging solutions for automotive and transportation, so you can stay ahead of the competition. Our smart imaging…
Energy, Mining and Natural Resources
Energizing the worlds infrastructure while maintaining sustainability is always a priority. Leica Microsystems has powerful and customizable microscopy solutions to help you get the most out of your…
Material Analysis Microscopes
Materials analysis requires microscope solutions for the imaging, measurement, and analysis of features across a variety of materials like metal alloys, semiconductors, glass and ceramics, as well as…
Industrial Microscopy Markets
Maximizing uptime and achieving targets efficiently help your bottom line. Leica microscope solutions can give you insights into the smallest sample details as well as analyze, document, and report…
Cross-Section Analysis for Electronics
Cross-section analysis for electronics enables detailed analysis of failure mechanisms of components like printed circuit boards (PCBs), assemblies (PCBAs), and integrated circuits (ICs).
Electronics and Semiconductor Industry
For electronics and semiconductors, solutions enabling efficient inspection, cross-section and cleanliness analysis, and R&D of PCBs, wafers, IC chips, and batteries are crucial.
Battery Manufacturing
Battery manufacturing has several key challenges concerning inspection. Solutions for sample preparation and microscopic visual and chemical analysis are needed.
