EM TIC020
Ion Beam Milling
Sample Preparation for Electron Microscopy
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EM TIC020 Triple Ion Beam Miller for Preparation of Slope Cuts
Archived Product
Replaced by
EM TIC 3X
In August 2011 the new Leica EM TIC 3X Triple Ion-Beam Cutter was launched and replaces the Leica EM TIC020!
The Leica EM TIC020 Triple Ion Beam Miller for preparation of slope cuts allows accurate and efficient site specific sample preparation for SEM analysis.
Obtain high quality cross sections from almost any material. Sample holders allowing a sample size up to 50x50x10 mm. Minimal mechanical preparation is required. The system features three ion beams with a three axis stage and viewing microscope.
For research use only
