EM TRIM2
Sample Preparation for Electron Microscopy
Products
Home
Leica Microsystems
EM TRIM2 Specimen trimming device for TEM, SEM, LM
Archived Product
Replaced by
EM RAPID
Read our latest articles
Workflow Solutions for Sample Preparation Methods for Material Science
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Brief Introduction to Specimen Trimming
Before ultrathin sectioning a sample with an ultramicrotome it has to be pre-prepared. For this pre-preparation, special attention must be paid to the sample size (size of the section), location of…
Perusing Alternatives for Automated Staining of TEM Thin Sections
Contrast in transmission electron microscopy (TEM) is mainly produced by electron scattering at the specimen: Structures that strongly scatter electrons are referred to as electron dense and appear as…
Fields of Application
Automotive & Transportation
We at Leica want to be your dependendable collaborators, guiding you to optimal imaging solutions for automotive and transportation, so you can stay ahead of the competition. Our smart imaging…
