David R. Barbero , PhD
Dr. David R. Barbero is an engineer and physicist who has over 15 years of experience in nanoscale opto-electronic materials, devices and displays. His work has been published in several top journals in Materials Science and Physics and highlighted in over 300 scientific newspapers and internet websites. He has a long experience in nano-patterning and nano-structuring of polymers and composites (optical lithography, nano-imprinting, colloidal, nanotubes, and polymer self-assembly). David obtained his PhD in Physics at the Cavendish Laboratory, University of Cambridge, UK, where he was a Marie-Curie Fellow, a European Cambridge Trust Scholar, and he was awarded the Abdus Salam runner-up prize in Physics from Cambridge University in 2009.
Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy
The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Burr Detection During Battery Manufacturing
See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Battery Particle Detection During the Production Process
How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
3 Factors Determine the Damage Potential of Particles
This article discusses the 3 factors for determining the potential of a particle to cause damage to parts and components in the automotive and electronic industry. These factors include the…
Studying Ocular Birth Defects
This article discusses how lens formation and ocular birth defects can be studied with sharp widefield microscopy images which are acquired rapidly. The mouse ocular lens is used as a model to study…
Factors to Consider for a Cleanliness Analysis Solution
Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Efficient Particle Counting and Analysis
This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
Cleanliness of Automotive Components and Parts
This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…
Top Challenges for Visual Inspection
This article discusses the challenges encountered when performing visual inspection and rework using a microscope. Using the right type of microscope and optical setup is paramount in order to…
How to Select the Right Solution for Visual Inspection
This article helps users with the decision-making process when selecting a microscope as a solution for routine visual inspection. Important factors that should be considered are described.
Introduction to 21 CFR Part 11 and Related Regulations
This article provides an overview of regulations and guidelines for electronic records (data entry, storage, signatures, and approvals) used in the USA (21 CFR Part 11), EU (GMP Annex 11), and China…
Why is Manual Visual Inspection of Medical Devices so Challenging?
This article discusses how manual visual inspection, which is prevalent in the medical device industry, can lead to inconsistent results. It also addresses the challenges quality managers and…
Keeping Particulate Contamination Under Control in Pharmaceutical Products
This article describes how a 2-methods-in-1 solution combining optical microscopy and laser induced breakdown spectroscopy (LIBS) can be utilized for identification of particulate contaminants in the…
How does an Automated Rating Solution for Steel Inclusions Work?
The rating of non-metallic inclusions (NMIs) to determine steel quality is critical for many industrial applications. For an efficient and cost-effective steel quality evaluation, an automated NMI…
Challenges Faced When Manually Rating Non-Metallic Inclusions (NMIs) to Determine Steel Quality
Rapid, accurate, and reliable rating of non-metallic inclusions (NMIs) is instrumental for the determination of steel quality. This article describes the challenges that arise from manual NMI rating,…
Reasons Why There is Growing Need for Fast and Reliable Steel Quality Rating Solutions
Steel quality is critical for the manufacturing of high-quality components and products. Fast, reliable, and accurate detection and classification of inclusions has become essential for both component…
Top Issues Related to Standards for Rating Non-Metallic Inclusions in Steel
Supplying components and products made of steel to users worldwide can require that a single batch be compliant with multiple steel quality standards. This user demand creates significant challenges…
Brief Introduction to Surface Metrology
This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…
Studying the Microstructure of Natural Polymers in Fine Detail
The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
