James DeRose , Ph.D.
James DeRose is a Global Marketing Communication Manager at Leica Microsystems. His focus is on optimized content creation for applications concerning life science, material science, as well as industry and manufacturing. He is involved with application notes, case studies, technical reports, white papers, application pages, product pages, social media posts, emails, testimonials, and other materials. He has worked at Leica Microsystems since 2013. In the past, he worked on applications development projects in the fields of interfacial chemistry and physics, thermal and chemical engineering, corrosion and metallography, surface coatings, materials science, biotechnology, and cellular biology. He has expertise with various types of microscopy and analytical methods.
The Polarization Microscopy Principle
Polarization microscopy is routinely used in the material and earth sciences to identify materials and minerals on the basis of their characteristic refractive properties and colors. In biology,…
Molecular Biology Analysis facilitated with Laser Microdissection (LMD)
Extracting biomolecules, proteins, nucleic acids, lipids, and chromosomes, as well as extracting and manipulating cells and tissues with laser microdissection (LMD) enables insights to be gained into…
Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy
The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
Leveraging AI for Efficient Analysis of Cell Transfection
This article explores the pivotal role of artificial intelligence (AI) in optimizing transfection efficiency measurements within the context of 2D cell culture studies. Precise and reliable…
Precision and Efficiency with AI-Enhanced Cell Counting
This article describes the use of artificial intelligence (AI) for precise and efficient cell counting. Accurate cell counting is important for research with 2D cell cultures, e.g., cellular dynamics,…
AI Confluency Analysis for Enhanced Precision in 2D Cell Culture
This article explains how efficient, precise confluency assessment of 2D cell culture can be done with artificial intelligence (AI). Assessing confluency, the percentage of surface area covered,…
Neuron Isolation in Spatial Context with Laser Microdissection (LMD)
After Alzheimer’s disease, Parkinson’s is the second most common progressive neurodegenerative disease. Before the first symptoms manifest, up to 70% of dopamine-releasing neurons in the mid-brain…
6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences
A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Burr Detection During Battery Manufacturing
See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Battery Particle Detection During the Production Process
How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
Rapid Check of Live Stem Cells in Cell-Culture Inserts set in Multi-Well Plates
See how efficient imaging of live iPSC stem cells within cell-culture inserts set in a multi-well plate can be done to evaluate the cells using a THUNDER Imager. Just read this article.
Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Technical Terms for Digital Microscope Cameras and Image Analysis
Learn more about the basic principles behind digital microscope camera technologies, how digital cameras work, and take advantage of a reference list of technical terms from this article.
Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
Cross-section Analysis for Electronics Manufacturing
This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Studying Virus Replication with Fluorescence Microscopy
The results from research on SARS-CoV-2 virus replication kinetics, adaption capabilities, and cytopathology in Vero E6 cells, done with the help of fluorescence microscopy, are described in this…
Understanding Clearly the Magnification of Microscopy
To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
Epi-Illumination Fluorescence and Reflection-Contrast Microscopy
This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…
ISO 9022 Standard Part 11 - Testing Microscopes with Severe Conditions
This article describes a test to determine the robustness of Leica microscopes to mold and fungus growth. The test follows the specifications of the ISO 9022 part 11 standard for optical instruments.
High-Quality EBSD Sample Preparation
This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.
Key Factors to Consider When Selecting a Stereo Microscope
This article explains key factors that help users determine which stereo microscope solution can best meet their needs, depending on the application.
Rapid and Reliable Examination of PCBs & PCBAs with Digital Microscopy
Digital microscopes provide users with a convenient and rapid way to acquire high-quality, reliable image data and make quick inspection and analysis of printed circuit boards (PCBs) and assemblies…
An Introduction to Fluorescence
This article gives an introduction to fluorescence and photoluminescence, which includes phosphorescence, explains the basic theory behind them, and how fluorescence is used for microscopy.
Central Nervous System (CNS) Development and Activity in Organisms
This article shows how studying central nervous system (CNS) development in Drosophila-melanogaster embryos expressing a GCaMP calcium indicator in the neurons can be improved with a THUNDER Imager.
What is the Patch-Clamp Technique?
This article gives an introduction to the patch-clamp technique and how it is used to study the physiology of ion channels for neuroscience and other life-science fields.
Differential Interference Contrast (DIC) Microscopy
This article demonstrates how differential interference contrast (DIC) can be actually better than brightfield illumination when using microscopy to image unstained biological specimens.
Digital Inspection Microscope for Industrial Applications
Factors users should consider before choosing a digital inspection microscope for industrial applications, including quality control (QC), failure analysis (FA), and R&D, are described in this…
Going Beyond Deconvolution
Widefield fluorescence microscopy is often used to visualize structures in life science specimens and obtain useful information. With the use of fluorescent proteins or dyes, discrete specimen…
Microscope Illumination for Industrial Applications
Inspection microscope users can obtain information from this article which helps them choose the optimal microscope illumination or lighting system for inspection of parts or components.
