Michael Doppler , MSc
Michael Doppler was a Sales Manager for the public sector for Eastern Europe, Middle East, and Africa before retiring.
He studied Mineralogy and Economic Geology in Heidelberg and received his Master of Science (MSc) in 1990. From 1990 to 1996 he worked as Scientific Collaborator at the Mineralogy Department of the University of Geneva/Switzerland.
Since 1996 he had various sales roles and Application Manager positions in Switzerland, Europe and Distributor sales areas for Leica Microsystems.
Understanding Clearly the Magnification of Microscopy
To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
Microscope Illumination for Industrial Applications
Inspection microscope users can obtain information from this article which helps them choose the optimal microscope illumination or lighting system for inspection of parts or components.
How to Boost your Microelectronic Component Inspection Performance
Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes?
Watch this free webinar…
How to Use a Digital Microscope to Streamline Inspection Processes
Watch this webinar for inspiration and expert advice on how to make quality control simpler, quicker, and easier. Learn how to perform comprehensive visual inspection, including comparison,…
Digital Microscopy in Earth Science
Classical polarized light (compound) microscopes can only be used for prepared samples, because the working distance they offer is insufficient for whole samples. This means that thicker and bigger…
Digital Microscopy in Forensics
Forensic experts work with a broad range of microscopes to examine evidence from firearms and tool marks, documents, forensic or legal medicine, hair and fibers as well as glass and paint. Digital…
