Wolfgang Grünewald , PhD
- Has a PhD in experimental physics, Department of Physics, Technical University of Chemnitz, Germany
- In his diploma and dissertation, he dealt with TEM investigation of thin films and ion milling as appropriate sample preparation method
- Worked 12 years as application manager at Bal-Tec, in development of ion milling systems and preparation methods
- Since 2008, worldwide specialist for Solid States sample preparation within Leica Microsystems
- Owner of 5 patents and author of many scientific publications
High-Quality EBSD Sample Preparation
This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.