Wolfgang Grünewald , PhD
- Has a PhD in experimental physics, Department of Physics, Technical University of Chemnitz, Germany
- In his diploma and dissertation, he dealt with TEM investigation of thin films and ion milling as appropriate sample preparation method
- Worked 12 years as application manager at Bal-Tec, in development of ion milling systems and preparation methods
- Since 2008, worldwide specialist for Solid States sample preparation within Leica Microsystems
- Owner of 5 patents and author of many scientific publications
High-Quality EBSD Sample Preparation
This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.
Porous Ceramics - Sample Preparation for SEM
Application Note for Leica EM RES102 - Ceramic membrane filters with pore sizes down to a few nanometres must be investigated in cross-section with regard to the structure of the pores. The smallest…
Paper Samples - Sample Preparation for SEM
Application Note for Leica EM RES102 - A coated paper sample has been prepared with ion beam slope cutting in order to test the procedure with regard to its applicability. With the use of ion beam…
Ion Beam Polishing of Sample Surfaces - Sample Preparation for SEM
Application Note for Leica EM RES102 - Ion milling can be used to reduce the roughness of sample surfaces. Small angles less than 6° with respect to the sample surface are necessary. The high voltage…
