How to Use a Digital Microscope to Streamline Inspection Processes

Doppler, Michael

November 08, 2021

How to Use a Digital Microscope to Streamline Inspection Processes

Webinar on-demand

When it comes to routine inspection, the stakes are always high. Watch this webinar for inspiration and expert advice on how to make quality control simpler, quicker, and easier. Learn how to perform comprehensive visual inspection, including comparison, measurement, and documentation tasks, with a single system using the Emspira 3 digital microscope.

The webinar recording is available in English, Italian and German.

Key Learnings

How to streamline your inspection by working digitally in stand-alone mode without the need for a PC.
Save time by doing everything from visual inspection to measurement and data sharing within a single system.
Enhance communication by automatically saving images on your network and easily sharing results with your co-workers.
Work your own way by combining the Emspira 3 digital microscope with a variety of accessories to fulfill your inspection needs.

Register to view the webinar

First Name

Last Name

Email

Company/Institution

Zip

Country/Region

Ask your question optional

Are you planning on making a purchase in the next 12 months?

Yes

No

I am interested in receiving information about products, services, events (workshops, webinars), and educational content from Leica Microsystems GmbH, their representatives, and other Danaher companies. I consent to be contacted by phone or email.

Yes

No

By clicking SUBMIT, I agree to Leica Microsystems GmbH's Terms of Use and Privacy Policy. I understand my privacy choices regarding my personal data as detailed in the Privacy Policy.

Webinar

Speakers

Michael Doppler, M.Sc.

Senior Advanced Workflow Specialist, Leica Microsystems

Michael Doppler is a Senior Advanced Workflow Specialist at Leica Microsystems. He studied Mineralogy and Economic Geology in Heidelberg, Germany and received his Master of Science (MSc) …

Authors

Michael Doppler , MSc

Leica Microsystems

Interested to know more?
Talk to our experts.

Price

I need a configuration or price info.

Demo

I need an on site or remote demo.

Service & Repair

I need repair, technical service, spare parts or service contract.

Application Support

I need assistance/training in how to operate my system properly, or how to run a specific application with my system.

Do you prefer personal consulting? Show local contacts

How to Use a Digital Microscope to Streamline Inspection Processes

Webinar on-demand

Related Articles

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

Visualizing Photoresist Residue and Organic Contamination on Wafers

Rapid Semiconductor Inspection with Microscope Contrast Methods

Michael Doppler, M.Sc.

Senior Advanced Workflow Specialist, Leica Microsystems

Interested to know more? Talk to our experts.

Price

Demo

Service & Repair

Application Support

Interested to know more?
Talk to our experts.