Science Lab
Science Lab
The knowledge portal of Leica Microsystems offers scientific research and teaching material on the subjects of microscopy. The content is designed to support beginners, experienced practitioners and scientists alike in their everyday work and experiments. Explore interactive tutorials and application notes, discover the basics of microscopy as well as high-end technologies – become part of the Science Lab community and share your expertise!
Factors to Consider for a Cleanliness Analysis Solution
Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…
Cleanliness Analysis for Particulate Contamination
Devices, products, and their components fabricated in many industries can be quite sensitive to contamination and, as a result, have stringent requirements for technical cleanliness. Measurement…
Efficient Particle Counting and Analysis
This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
Quality Control Under the Microscope
Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
Hydraulics in the Automotive and Aerospace Industries
Cleanliness standards relating to lubricants, hydraulic fluids, and oils, e.g., ISO 4406 and DIN 51455 are discussed in this article. Cleanliness plays a central role in the automotive and…
Cleanliness of Automotive Components and Parts
This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…
High Speed for Your Material Analysis Workflow
Learn from our expert, Dr. Konstantin Kartaschew, how the intelligent combination of light microscopy with laser-induced breakdown spectroscopy (LIBS) will truly accelerate your root-cause-analysis…
How to Boost your Microelectronic Component Inspection Performance
Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes?
Watch this free webinar…
How to Select the Right Solution for Visual Inspection
This article helps users with the decision-making process when selecting a microscope as a solution for routine visual inspection. Important factors that should be considered are described.
