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26 Feb 2025

Practical Applications of Broad Ion Beam Milling

Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
Basalt imaged with crossed polarizers

Digital Microscopy in Earth Science

Classical polarized light (compound) microscopes can only be used for prepared samples, because the working distance they offer is insufficient for whole samples. This means that thicker and bigger…
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