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Tauchen Sie ein in detaillierte Artikel und Webinare, die sich mit effizienter Inspektion, optimierten Arbeitsabläufen und ergonomischem Komfort in industriellen und pathologischen Umgebungen befassen. Zu den behandelten Themen gehören Qualitätskontrolle, Materialanalyse, Mikroskopie in der Pathologie und vieles mehr. Sie erhalten wertvolle Einblicke in den Einsatz von Spitzentechnologien zur Verbesserung der Präzision und Effizienz von Fertigungsprozessen sowie zur präzisen pathologischen Diagnose und Forschung.

Leitz Laborlux: Tartaric acids, polarization contrast

Das Prinzip der Polarisationsmikroskopie

Die Polarisationsmikroskopie wird in den Material- und Geowissenschaften routinemäßig eingesetzt, um Materialien und Mineralien anhand ihrer charakteristischen Brechungseigenschaften und Farben zu…

Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.

Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…

Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.

Material sample with a large height, size, and weight being observed with an inverted microscope.

Five Inverted-Microscope Advantages for Industrial Applications

With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…

Geringe Vergrößerung DVM6-Bild eines Teils der PCBA-Probe.

Schnelle und zuverlässige Untersuchung von Leiterplatten und Leiterplattenbaugruppen mittels Digitalmikroskopie

Digitalmikroskope bieten Anwendern eine bequeme und schnelle Möglichkeit zur Erfassung hochwertiger, zuverlässiger Bilddaten und zur schnellen Inspektion und Analyse von Leiterplatten (PCBs) und…

The principle of the FusionOptics technology: Of the two separate beam paths (1), one provides depth of field (2) and the other high resolution (3). In the brain, the two images of the sample are merged into a single, optimal 3D image (4).

What is the FusionOptics Technology?

Leica stereo microscopes with FusionOptics provide optimal 3D perception. The brain merges two images, one with large depth of field and the other with high resolution, into one 3D image.