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Capture life as it happens
With the Leica Nano Workflow, searching for the needle in the haystack is a thing of the past. Take advantage of correlative light and electron microscopy to identify directly the right cell at the…
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Analyzing Non-metallic Inclusions in Steel
Oftentimes we find ourselves caught up in tedious analyses by reticle and comparison chart, time-consuming double-evaluation according to several standards or subjective inspection results with a bias…
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Expanding the Limits of Electron Microscopy Sample Preparation
Capturing the intricate changes in fine structure or in cell dynamics with conventional cryo solutions can be challenging sometimes. Leica Microsystems has developed a new cryo platform, the Leica EM…
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Practical Applications of Broad Ion Beam Milling
Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
