Industrial

Industrial

Industrial

Sumérjase en artículos detallados y seminarios web centrados en la inspección eficaz, los flujos de trabajo optimizados y la comodidad ergonómica en contextos industriales y patológicos. Los temas tratados incluyen el control de calidad, el análisis de materiales y la microscopía en patología, entre muchos otros. Este es el lugar donde obtendrá información valiosa sobre el uso de tecnologías de vanguardia para mejorar la precisión y la eficacia de los procesos de fabricación, así como el diagnóstico y la investigación patológicos precisos.
Image of a Siemens star, where the diameter of the 1st black line circle is 10 mm and the 2nd is 20 mm, taken via an eyepiece of a M205 A stereo microscope. The rectangles represent the field of view (FOV) of a Leica digital camera when installed with various C-mounts (red 0.32x, blue 0.5x, green 0.63x).

Understanding Clearly the Magnification of Microscopy

To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
SEM image of the full Li-NMC electrode sample, showing the two porous layers and the metal film at the center of the structure.

Cross Section Ion Beam Milling of Battery Components

Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…

Brief Introduction to Surface Metrology

This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…
Extended Depth of Focus (EDOF) images

How To Create EDOF (Extended Depth of Focus) Images

Watch this video to see how you can rapidly record sharp optical microscope images of samples with a large height variation. This is done with the optional Extended Depth of Focus (EDOF) function of…
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