EM AC20
EM Preparazione del campione
Prodotti
Home
Leica Microsystems
EM AC20 Sistema di contrasto automatico per sezioni ultra sottili
Leggi gli articoli più recenti
Brief Introduction to Contrasting for EM Sample Preparation
Since the contrast in the electron microscope depends primarily on the differences in the electron density of the organic molecules in the cell, the efficiency of a stain is determined by the atomic…
Perusing Alternatives for Automated Staining of TEM Thin Sections
Contrast in transmission electron microscopy (TEM) is mainly produced by electron scattering at the specimen: Structures that strongly scatter electrons are referred to as electron dense and appear as…
