ライフサイエンス

ライフサイエンス

ライフサイエンス

様々な科学分野における顕微鏡の知識、研究技術、そして実用的な応用を深めるための場です。正確な観察、画像解析、そして研究の進歩を実現する方法を学びましょう。高度な顕微鏡技術、イメージング技術、サンプル前処理、画像解析に関する専門的な知見を提供します。最先端のアプリケーションやイノベーションを中心に、細胞生物学、神経科学、がん研究などの分野を幅広くカバーしています。
Documentation of an automotive clutch friction surface with a digital microscope

Automotive Part Verification and Development according to Specifications

Automotive part verification during the development and production of parts and components by suppliers or manufacturers is important for ensuring that specifications are met. Specifications are…

暗視野顕微鏡

暗視野コントラスト法は、生体試料の構造や物質試料の不均一な特徴から生じる光の回折や散乱を利用する方法です。
Leitz Laborlux: Tartaric acids, polarization contrast

The Polarization Microscopy Principle

Polarization microscopy is routinely used in the material and earth sciences to identify materials and minerals on the basis of their characteristic refractive properties and colors. In biology,…
Image of magnetic steel taken with a 100x objective using Kerr microscopy. The magnetic domains in the grains appear in the image with lighter and darker patterns. A few domains are marked with red arrows. Courtesy of Florian Lang-Melzian, Robert Bosch GmbH, Germany.

Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy

The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
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