ライフサイエンス | 学びと共有 | Leica Microsystems

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ライフサイエンス

ライフサイエンス

様々な科学分野における顕微鏡の知識、研究技術、そして実用的な応用を深めるための場です。正確な観察、画像解析、そして研究の進歩を実現する方法を学びましょう。高度な顕微鏡技術、イメージング技術、サンプル前処理、画像解析に関する専門的な知見を提供します。最先端のアプリケーションやイノベーションを中心に、細胞生物学、神経科学、がん研究などの分野を幅広くカバーしています。

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.

How to Prepare and Analyse Battery Samples with Electron Microscopy

This workshop covers the sample preparation process for lithium and novel battery sample analysis, as well as other semiconductor samples requiring high-resolution cross-section imaging.

Workflows and Instrumentation for Cryo-electron Microscopy

Cryo-electron microscopy is an increasingly popular modality to study the structures of macromolecular complexes and has enabled numerous new insights in cell biology. In recent years, cryo-electron…

Introduction to Ion Beam Etching with the EM TIC 3X

In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…

Macroscale to Nanoscale Pore Analysis of Shale and Carbonate Rocks

Physical porosity in rocks, like shale and carbonate, has a large effect on the their storage capacity. The pore geometries also affect their permeability. Imaging the visible pore space provides…

Practical Applications of Broad Ion Beam Milling

Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…